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XOP 2.1 — A New Version of the X‐ray Optics Software Toolkit

Del Río, Manuel Sánchez ; Dejus, Roger J.

Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California (USA) (25-29 August 2003): AIP Conference Proceedings, 12 May 2004, Vol.705(1), pp.784-787 [Tạp chí có phản biện]

ISBN: 0-7354-0179-9 ; ISSN: 0094-243X ; E-ISSN: 1551-7616 ; DOI: 10.1063/1.1757913

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  • Nhan đề:
    XOP 2.1 — A New Version of the X‐ray Optics Software Toolkit
  • Tác giả: Del Río, Manuel Sánchez ; Dejus, Roger J.
  • Chủ đề: Accelerators and Beams
  • Là 1 phần của: Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California (USA) (25-29 August 2003):;
    AIP Conference Proceedings, 12 May 2004, Vol.705(1), pp.784-787
  • Mô tả: X‐ray oriented programs (XOP) is a graphical user‐interface environment for computer codes of interest to the synchrotron radiation community. It provides codes for i) modeling of x‐ray sources (e.g., synchrotron radiation sources, such as undulators and wigglers), ii) calculating characteristics of optical elements (mirrors, filters, crystals, multilayers, etc.), and iii) multipurpose data visualizations and analyses. The current version of XOP (2.0) has been widely distributed at synchrotron facilities and research laboratories. It can be downloaded from http://www.esrf.fr/computing/scientific/xop , and it is also distributed on a CD‐ROM. Today, we count over 400 registered users. We describe recent developments including improved documentation and user interface, and upgraded applications. The functionality of XOP can be extended with external plug‐ins (extensions). We continue to support a visual interface to the SHADOW ray‐tracing program and the multilayer package IMD.
  • Ngôn ngữ: English
  • Số nhận dạng: ISBN: 0-7354-0179-9 ; ISSN: 0094-243X ; E-ISSN: 1551-7616 ; DOI: 10.1063/1.1757913

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