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Performance Measurements at the SLS Spectroscopy Beamline

Flechsig, U. ; Patthey, L. ; Schmidt, T.

Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California (USA) (25-29 August 2003): AIP Conference Proceedings, 12 May 2004, Vol.705(1), pp.316-319 [Tạp chí có phản biện]

ISBN: 0-7354-0179-9 ; ISSN: 0094-243X ; E-ISSN: 1551-7616 ; DOI: 10.1063/1.1757797

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  • Nhan đề:
    Performance Measurements at the SLS Spectroscopy Beamline
  • Tác giả: Flechsig, U. ; Patthey, L. ; Schmidt, T.
  • Chủ đề: Accelerators and Beams
  • Là 1 phần của: Synchrotron Radiation Instrumentation: Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California (USA) (25-29 August 2003):;
    AIP Conference Proceedings, 12 May 2004, Vol.705(1), pp.316-319
  • Mô tả: The Surfaces and Interfaces Spectroscopy beamline (SIS) started user operation in spring 2002 as one of the first beamlines at SLS. It is optimized for high resolution photo electron spectroscopy. The beamline concept with two helical undulators plus a plane grating monochromator with grazing‐ and normal incidence optics is very flexible and offers a well balanced performance from 10 eV to 800 eV. We report on beamline features and performance measurements. The final characterization is still in progress since not all options have been commissioned so far.
  • Ngôn ngữ: English
  • Số nhận dạng: ISBN: 0-7354-0179-9 ; ISSN: 0094-243X ; E-ISSN: 1551-7616 ; DOI: 10.1063/1.1757797

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